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The LL158 Series produces an oblique (30°) line of illumination for line scan applications in a passively cooled design.
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When oriented across a moving web or conveyor line, unlike standard line lights, this linear light’s unique geometry highlights engraved or raised lines that run parallel to the material travel.
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Provides an intensity level of 53kLux (working distance of 75mm).
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Pre-engineered for expandability in 6” (152mm) increments up to 90” (2.28m).
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Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
Meatest - M194 High Resistance Decade
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10 kΩ - 100.0 GΩ, short function
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Hot-switching up to 6 kVdc limit
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Test voltage and current indication
High resistance decade with built-in test signal meter for calibration of high resistance meters up to 6 kV. Based on M6xx Real-Resistance decade series with short function for short current testing.
M194 High Resistance Decade is designed for calibration of insulation testers, megaohmmeters and resistance ranges of safety testers, HIPOT testers or any other DC high resistance meter with test voltage up to 6 kV. Apart from resistance source in continuous range from 10 kΩ to 100 GΩ, the M194 has built-in multimeter indicating either test voltage in resistance function or mA current in short function for testing of UUT's short current.
Time-proven design
Based on M6xx series, this programmable decade comes with similar benefits - large LCD showing relevant parameters including total accuracy, automatically compensated parasitic resistances, easy recalibration procedure and extensive remote control connectivity via RS232, IEEE488, USB and Ethernet.
DC resistance |
10 kΩ - 100 GΩ, 6.3 kV max. ± 0.1% / year |
Test Signal Meter
DC voltage |
50 V - 6.3 kV ± 0.5% / year |
DC current |
0 - 10 mA ± 0.2% / year |
More Product Information
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
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Prevent thin wafers from curling and breaking
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Safety interlock system with clear enclosure for operator safety during device measurements
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Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
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Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
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Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (31 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
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Camera and IEEE 1394b cable (other configurations on request)
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
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Affordable GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 344 fps at full resolution
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GigE Vision interface with PoE+
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor-cooling, no fan
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Extended operating temperature range
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1500VA, 1000W AC, 120VAC , 50/60Hz Input and 120VAC 50/60Hz Output, Double Conversion, On-Line, High Temperature, Lithium Iron Phosphate Battery Hot Swap Drawer, Rugged UPS with Power Factor Correction
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The T‑Gauge® Control Unit (TCU) is the central component of the T‑Gauge® family of products and serves as the source of the optical and electrical signals necessary to generate and detect terahertz. The TCU also transforms analog data into a digital signal that can be analyzed using the onboard processor and interacts with the wide variety of THz accessories.
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The TCU is a 19 inch (483 mm) rack, wall, or table mountable instrument, consisting of an ultrafast laser, high-speed optical delay, ranging optical delay, power supplies, and signal conditioning electronics, with connectors for convenient interfacing to various optical and electronic components. The high-speed delay included in the TCU can be chosen from a number of delay length and speed options. When utilized in conjunction with T-Gauge® accessories, the TCU enables the user to generate and detect pulsed terahertz energy for a wide variety of measurements.
Meatest
We develop and manufacture electrical calibration instruments for calibration laboratories and testing facilities in electronics, engineering, utility, aeronautics and telecommunications sectors. Designed for automated calibrations our instruments bring effective solutions to customers like NPL, Samsung, Siemens and Volkswagen.
Contact Details
Meatest, spol. s r.o. Headquarters
Železná 509/3, Czech Republic - 619 00 BRNO
GPS: 49°10'13.93"N,16°36'53.2"E
Phone: 420-543-250-886
Fax: 420-543-250-890
Email: meatest@meatest.cz