FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
More Product Information
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Guarantees fully-guarded measurements to fA and fF levels
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Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
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Allows probing of different pad materials and sizes
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Fast replacement of worn probes without the need for tools
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Versatile GPS Master Clock with IRIG-B reference input
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Dual 10/100BaseT Network interface with Network Time Protocol (NTP)
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Time Code Outputs, IRIG B, IRIG E, Have Quick
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High Stability Ovenized oscillator is standard
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Single string or dual redundant configuration
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Ruggedized for Shipboard Usage
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Dual Hot-Swappable Power Supplies
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3000VA, 2700W, 440VAC 3Ph 60Hz Isolated Input, 220VAC 60Hz Output, Freq Changer, 12BHS (10.5Ah) EBM, 2U24.7,L16-20P AC Input Panel Mount, L6-30R AC Ouput Panel Mount, SNMP, 2 x 2 Anderson EBP, Neutral Bonding Switch,with Slide Kit for 32RU Rack, Double Conversion, Rugged, High Temperature, On-line UPS, and Power Factor Correction
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Camera Link InGaAs SWIR camera
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VGA resolution
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Large pixel with high dynamic
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Compact industrial design, no fan
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Simple camera configuration via GenCP
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Compact industrial design
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Very high intra-scene dynamic range of 73 dB
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Camera Link interface with GenCP support
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor cooling, no fan
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Extended operating temperature range
Our RF horn antennas exhibit increasing gain, with frequency up to 18 dBi at 1000 MHz, helping to compensate for losses that occur elsewhere in an RF test system. Use these antennas in shielded rooms or free space.
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Up to 25 GHz bandwidth (probe + oscilloscope)
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System rise time as fast as 13 ps (20-80%)
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Highest bandwidth Solder-In solution (25 GHz)
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Ultra-compact browser tip (22 GHz)
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Superior probe impedance minimizes AC loading on device under test (DUT)
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Carbon-composite browser tips optimizes signal fidelity and loading
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Probe noise as low as 14 nV/√Hz (1.6 mVrms)
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Low probe attenuation
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Large operating voltage range
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±4 V common mode range
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±2.5 V offset range
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2.0 Vpk-pk dynamic range
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Long length Solder-In tip with field replaceable resistors
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Designed for use with specific Probe Systems
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Tables to suit all facility requirements and applications
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Stable probing, even in submicron range
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Granite platen ensures rigidity and temperature stability
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Can be combined with the Shield Enclosures
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1500VA, 1350W, 115VAC at 60Hz Input and 115VAC at 60Hz Output, Double Conversion, Rugged, High Temperature, Isolated Online UPS with Hot Swap Battery Drawer and Power Factor Correction for Navy Shipboard Applications
The PPE series of probes are suitable for a wide range of applications where high-voltage measurements must be made safely and accurately. There are five fixed-attenuation probes covering a range from 2 kV to 20 kV, and one switchable probe providing ÷10/÷100 attenuation for voltage inputs up to 1.2 kV.
New technology which utilizes hybrid circuitry (and switch reading for probes with switchable gain/attenuation) minimizes ringing and overshoot to provide a precise response.
All fixed-attenuation, standard probes automatically re-scale any Teledyne LeCroy 9300C or LC series oscilloscope for the appropriate attenuation factor of the probe.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000