FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
Customization Examples
Waveguide with customized bracket
300 mm chuck with large tweezer pocket
RF positioner with micrometer screws
Double-side setup for emission microscopy
Combined microscope movement for scope and black body
mmW setup with North/South positioner platform
More Product Information
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Full-radius, nickel-plated tungsten needles
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Power bypass inductance: 16 nH
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Supports collinear and non-standard needle configurations
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Support up to a maximum of 12 ceramic blades DC needles / contacts
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
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Supports link widths up to 16-lanes
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Operates up to 16GTps, PCIe 4.0 data rates
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Downward compatible with PCIe 1.0, 2.0 and 3.0 data rates of 2.5, 5.0 and 8.0GTps
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A top edge 16-lane CEM slot connector accepts all endpoint DUT adapter cards
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Bottom edge 16-lane PCB finger connector installs into host test system’s 16-lane PCIe slot
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Data path uses high-speed linear redrivers to ensure good signal capture with minimal tuning
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Supports Analyzer side-band signal triggering and capture via custom cable
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Supports error injection for deep system analysis
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Interposer power is independent of host system. A 120/220 AC in, 12V/3A DC out converter is included
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Custom, exchangeable brackets enable secure chassis and endpoint card installations
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LEDs give quick indication of power and operation
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Format: Design is based on the 16-lane Card Electro-Mechanical (CEM) specification
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Size: 230mm deep x 185mm tall x 15mm thick
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Supported by Xgig tool suite including Trace Control, Expert and Serialytics
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32GTps, PCIe 5.0 data rate operation. Fully compatible with other PCIe data rates of 2.5, 5.0, 8.0 and 16 GTps
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Link widths to 16-lanes, including 1-, 2-, 4-, 8-lanes
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256GB memory (128GB upstream and 128GB downstream)
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Memory segmentation for capture of multiple traces
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Host-Client connection for remote debugging using Ethernet or local debugging using USB
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SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
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Simultaneous capture of multiple links is allowed with multiple simultaneous users
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Decodes all PCIe, NVMe and CXL traffic at all layers of the stack including the TLP, DLLP, and PHY layer packets
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Flexible trigger events include training sequences, ordered sets, queue pairs, PRPs, SGL, SMB, etc.
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Cascade captures from up to four Xgig chassis into a single trace view
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Full support of PCI Express LTSSM analysis
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Field replaceable power supply
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LEDs give quick indicators of power and link status
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Includes one-year hardware and three-year software warranties
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Works with the VIAVI Xgig software tool suite: Trace Control, Trace View, Expert™, Serialytics™
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Supported by a wide variety of Interposers (CEM, U.3, etc.)
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Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
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Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
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LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
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Automatic load inductance compensation function ensures the most repeatable calibrations
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Easy to use Probe to ISS/CSR matching tool
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Additional remoting methods
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Interface with Velox™ over LAN
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
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Designed for use with specific Probe Systems
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Tables to suit all facility requirements and applications
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Stable probing, even in submicron range
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Granite platen ensures rigidity and temperature stability
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Can be combined with the Shield Enclosures
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Accommodates a combination of up to four Cascade Microtech probes
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Configurable for mixed-signal RF/mmW testing
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Quick and easy repairs to be performed in the field, by simply replacing individual probes
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Adaptable to new device layouts by exchanging individual probes
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IntelliPower Breaker Distribution Panel with a 100 amp rating, for power distribution from customer generator to UPS Inputs
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Manufactured for Military, Industrial and Commercial applications
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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