Teradyne is a leading supplier of automation equipment for test and industrial applications. Teradyne Automated Test Equipment (ATE) is used to test semiconductors, wireless products, data storage and complex electronic systems, which serve consumer, communications, industrial and government customers. Our Industrial Automation products include Collaborative Robots used by global manufacturing and light industrial customers to improve quality and increase manufacturing efficiency. In 2015, Teradyne had revenue of $1.64 billion and currently employs approximately 4,200 people worldwide. Our stock is listed on the New York Stock Exchange under the symbol TER.

In an industry where innovation is key to long-term success, we are the proven experts. We listen to our customers and share their customers’ same reliance on device functionality. That understanding and deep expertise helps us to apply creative solutions to the most challenging test problems. Our approach creates value for our customers, value for our employees and value for our shareholders.

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Semiconductor Test Production Board Test
Storage Test Wireless Test
Defense & Aerospace Coolaborative Robots



Teradyne - Ai-710 Analog Test Instrument

Teradyne’s Ai-710 offers innovative capabilities for high-density, analog functional test in a physically compact format—a single C-size VXI module. The Ai-710 combines superior performance with the advantages of a standard, commercial-off-the-shelf architecture—flexibility, configurability and high reliability—and lower acquisition and lifecycle costs.

Integrated in key DoD ATS systems, as well as in commercial test systems, the Ai-710’s functional test capabilities have been field-proven in a range of defense, aerospace and commercial applications.


Teradyne - Ai-760 Series Analog Test Instruments

Teradyne’s Ai-760 Series delivers functionality and high-performance in a small form factor, consolidating essential elements of any ATS system—DMM, DSO, timer counter and AWG. With parallel source and measure capability, the Ai-760 Series increases TPS throughput and enables operational test of units under test. The Ai-760 Series is ideal for reducing test costs and test time, while increasing test coverage. The Series' unique combination of functional density and unified control of multiple instruments allows system integrators to decrease tester footprint and increase test performance.


Teradyne - Bi-Series Bus Test Instrumentation

With up to four buses of emulation in a single VXI slot, Teradyne’s Bi-Series of serial bus test instruments (BTI) assume a wide range of serial bus protocols required in defense and aerospace test environments. The Bi-Series BTI is software-reconfigurable to assume the bus protocol requirements of serial communications buses used in operational or factory environments. Because our BTI are able to both emulate and test serial buses, they eliminate the need for a broad range of individual, protocol-specific test instruments. The Bi-Series provides a convenient solution that reduces the overall cost of test and simplifies the logistics involved in setup and deployment of multiple test systems.


Teradyne - Design-to-Build (D2B) Software

The unique capabilities of Teradyne's D2B software enable EMS and OEM manufacturers and partners to interconnect their global enterprises to optimize printed circuit board assembly test and inspection efficiencies early in the manufacturing / build cycle. D2B is a powerful suite of solutions that provides a standards-based architecture that supports GenCAM and ODB++ file formats enabling electronic manufacturers to outperform their competition, maximize profitability, and get to market first.



Teradyne - Di-Series Digital Test Instruments

Teradyne’s Di-Series of digital test instruments provides the industry’s most powerful combination of performance, density, flexibility, and reliability in a highly integrated, standards-based solution. The Di-Series increases usability, functionality, and commonality, while reducing the total number of instruments needed by a test system. Using Di-Series instruments decreases a test systems' footprint, programming, support and cost-of-ownership. As part of Teradyne’s Core System Instrumentation (CSi) portfolio, the Di-Series instruments meet the essential requirements common to defense and aerospace ATE. The Di-Series instruments also provide the key features needed to test all levels of integration from the board level shop replaceable assembly/shop replaceable unit (SRA/SRU) to box level line replaceable unit/weapon replacement assembly (LRU/WRA).


Teradyne - ETS-200T / ETS-200T-FT Test System

The ETS-200T / ETS-200T-FT discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. Both the ETS-200T and the ETS-200T/FT provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter. Raptor™ software reduces program generation by providing a graphical user interface that does not require any programming experience combined with a robust set of test libraries and proven test techniques to increase test volumes and reduce cost of test.


Teradyne - ETS-364 / ETS-600 Test Systems

The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.


Teradyne - ETS-800 Test System

The ETS-800 test system covers a broad range of analog, digital, and mixed-signal applications such as Automotive SOCs (System-on-a-Chip), Power Management ICs, and general purpose analog and mixed-signal devices. The system provides an air-cooled test head containing four sectors of instrument slots. Each sector contains 10 slots for a total of 40 test head slots to accommodate a robust suite of instruments. The system also includes a mainframe cabinet containing an AC power distribution unit, DC and AC system power supplies, and a 19” rack for optional instrumentation. An optional test head manipulator is offered for docking with automated device handling equipment.


Teradyne - ETS-88 Test System

The ETS-88 is a new breed of high-performance multisite production test equipment that focuses on high-volume mixed-signal commodity and precision devices. Highly scalable, the ETS-88 provides four reconfigurable test heads that allow customers to run up to four independent applications simultaneously. The ETS-88 is fully compatible with Eagle's product family, using the same pattern-based floating resources and Eagle Vision Software that customers expect from an Eagle platform.


Teradyne - High Speed Subsystem

The Teradyne PXI Express-based High Speed Subsystem (HSSub) addresses defense and aerospace ATE requirements that are common to most recent designs including buses with increasing speeds, protocol complexity, big data handling and processing demands. HSSub further accommodates the need for lower latency interaction with the unit under test. HSSub is designed for integration into existing or future test systems with the ease of a single LXI instrument. Alternatively, it can be used in a standalone role for test development or as a bench-top tester. HSSub provides the most economical approach for developing and sustaining test capability for the range of test problems facing engineers today.



Teradyne - IP750 Test System - High-Speed, High-Quality Image Sensor Test

Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's  IG-XL software environment provides easy, shorter test program development and easy maintenance.


Teradyne - J750 Test System - Low Cost, High Efficiency Parallel Test

Teradyne’s J750 platform is the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices. The system is widely available at more than 50 OSAT locations and is supported by a complete set of production interface solutions for wafer sort and final test.